Grain size measurement of nanocrystalline gold by X-ray diffraction method

The X-ray diffraction profiles on nanocrystalline gold prepared by the gas deposition method were studied by Warren-Averbach and integral breadth analysis for the evaluation of grain sizes and internal strains. The grain size of as-prepared specimens, estimated by Warren-Averbach analysis, was in the range of 7 to 20nm. The thermal stability of these specimens was found to be quite high; when annealed for 1h, the grain size remained unchanged up to 770K and grew about twice at 1070K. The root mean square strain, estimated by integral breadth analysis, was in the range of 0.8–2.3 × 10⁻³ and reduced to ˜3 × 10⁻⁴ after annealing at 870K and higher.