Scanning tunneling microscopy is very important technology in nanotechnology, because it makes possible atom manipulation. The technique is based upon a phenomenon discovered in the 1960s, if a conducting surface is brought within 1 nm from the tip of the instrument and a potential difference is applied between the tip and the surface, then a “tunneling current” will flow. The relation of the current towards the distance is known and, thus, the machined surface can be depicted. The invention that greatly advanced nanotechnology used was the “scanning tunneling microscope”, developed in the laboratories of IBM in Zurich, making possible not only to measure and depict surfaces at molecular scale, but, also, to manipulate atoms and put them in designated positions. The main disadvantage of this method is that it can be only applied to conducting materials and, therefore, atomic force microscopy has been designed to overcome this disadvantage.